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Diffractive imaging

Selected publications by John Rodenburg on the subject of diffractive imaging and related techniques.

When I started working in this subject area, the term 'diffractive imaging' did not exist. My interest has been concerned with solution of the phase problem in the context of a moving source of illumination, as is commonly found in the imaging geometry of the scanning transmission electron microscope. Nowadays, the term diffractive imaging has been applied to what I call the 'pure diffractive imaging problem', or PDI: that is, the question of solving for the phase of a diffraction pattern by using a-priori information about the limited size of the object function. In fact, the moving illumination diffraction problem contains much more phase information, although the best way to extract it is not obvious. This source of information is sometimes called 'pytographical' information (following the work of Hoppe), although this term is usually only associated with cystalline objects. Continuous objects can be handled by Wigner distribution deconvolution, or variants (such as the 'half-roe dash' approximation, suitable for weak, kinematical objects). My more recent work with Helen Faulkner has centred on the application of iterative methods to this rich data set.

The great potential advantage of diffractive imaging is that it is not so subject to the problem of instabilities and partial coherence as conventional imaging. It is for this reason that it could lead to a much higher resolution electron microscope.

Interested readers new to this area would be advised to start with the articles marked with '*'


Faulkner, H.M.L and Rodenburg, J.M.
     ‘Error tolerance of an iterative phase retrieval algorithm
     for moveable illumination microscopy’
     Ultramicroscopy 103 (2005) 153-164 

Rodenburg, J.M. and Faulkner, H.M.L
     ‘A phase retrieval algorithm for shifting illumination’
     Applied Physics Letters 85 (21) 4795-4797
     
Faulkner, H.M.L. and Rodenburg, J.M
     ‘Moveable aperture lensless transmission microscopy: a novel
     phase retrieval algorithm’
     Physics Review Letters, 93 (2) (2004) 023903/1-4

*Rodenburg , J.M.
     ‘A simple model of holography and some enhanced resolution
	methods in electron microscopy’
     Ultramicroscopy 87 (2001) 105-121 full_paper_PDF

Nellist, P.D. and Rodenburg, J.M.
     'Electron Ptychography I: experimental demonstration beyond
	the conventional resolution limits'
     Acta Cryst A54 (1998) 49-60

Plamann, T. and Rodenburg, J.M.
     'Electron Ptychography II: theory of three-dimensional
	scattering effects’
     Acta Cryst A54 (1998) 61-73

Nellist, P.D., McCallum, B.C. and Rodenburg, J.M.
     'Resolution beyond the 'information limit' in transmission
	electron microscopy'
     Nature, 374 (1995) 630-632

Plamann, T. and Rodenburg, J.M.
     'Double Resolution Imaging with Infinite Depth of Focus in
	single lens scanning microscopy'
     Optik 96 (1994) 31-36

Nellist, P.D. and Rodenburg, J.M.
     'Beyond the conventional information limit: the relevant
	coherence function'
     Ultramicroscopy 54 (1994) 61-74

McCallum, B.C. and Rodenburg, J.M.(P)
     'An error analysis of crystalline ptychography in the STEM
	mode'
     Ultramicroscopy 52 (1993) 85-99

Rodenburg, J.M., McCallum, B.C. and Nellist, P.D. 'Experimental
	Tests on Double Resolution Coherent Imaging via STEM'
     Ultramicroscopy 48 (1993) 304-314 full_paper_PDF

McCallum, B.C. and Rodenburg, J.M.
     'Simultaneous Reconstruction of Object and Aperture Functions
     from Multiple Far-field Intensity Measurements’
     J Opt Soc Am A 93 (1993) 231-239

McCallum, B.C. and Rodenburg, J.M.
     '2D Optical Demonstration of Wigner Phase-Retrieval
	Microscopy in STEM'
     Ultramicroscopy 45 (1992) 371-380 full_paper_PDF (half-tones 
very poorly reproduced)

Friedman, S.L. and Rodenburg, J.M.
     'Optical Demonstration of a New Principle of Far-Field
	Microscopy'
     J Phys D: Appl Phys 25 (1992) 147-154

*Rodenburg, J.M.and Bates, R.H.T.
     'The Theory of Super-Resolution Electron Microscopy via
	Wigner Distribution Deconvolution'
     Phil Trans A 339 (1992) 521-553

Bates, R.H.T and Rodenburg, J.M.
     'Sub-Angstrom Transmission Microscopy: a Fourier Transform
     Algorithm for Microdiffraction Plane Intensity
     Information'Ultramicroscopy 31 (1989) 303-308

*Rodenburg, J.M.
     'The Phase Problem, Microdiffraction and Wavelength-Limited
	Resolution'
     Ultramicroscopy 27 (1989) 413-422 full_paper_PDF


Conference papers:

Rodenburg, J.M. 
	‘Can Ronchigrams provide a route to sub-angstrom tomographic
	reconstruction?’
	EMAG Oxford, Inst Phys Conf Conf Ser 179 (2004) 185

Rodenburg JM
	‘Weak lens diffractive imaging’
	Proceedings 13th European Microscopy Congress Antwerp (2004) 379

Faulkner HML and Rodenburg JM
	‘Super-resolution in STEM with moving-probe phase retrieval:
	analysis of success given incorrect initial parameters’
	Proceedings 13th European Microscopy Congress Antwerp (2004) 431

Rodenburg, J.M.
     'Beyond the information limit: a generalisation of imaging
	via diffraction'    EUREM 96 (Dublin) (1996)

Rodenburg, J.M. (invited) and Nellist, P.D.
     'Multidetector methods for super-resolution in STEM'
     2nd NIRIM International Symposium on Advanced Materials, Ed
	Bando, Y.,
     Kamo, M. Haneda, H. and Aizawa, T., Tsukuba, Japan (1995) 109


Colman, C P and Rodenburg, J.M.
     'Super-resolution STEM imaging in the presence of specimen
	drift'
     EMAG 95: IoP Conf Ser No 147 (1995) 107

Plamann, T. and Rodenburg, J.M.
     'Ptychographical imaging of sphalerite structures'
     EMAG 95: IoP Conf Ser No 147 (1995) 117

Rodenburg, J.M.
     'Reducing uncertainties and improving resolution in coherent
	STEM imaging'
     MAS’ 93 meeting, Los Angeles, Microbeam Analysis 2 (1993) 202

Rodenburg. J.M.
     'Below the 1 Å coherent resolution limit: does the future lie
	with STEM'
     Inst Phys Conf Ser No 138 (1993) 235

Nellist, P.D. and Rodenburg, J.M.
     'Image resolution improvement using coherent microdiffraction
	in STEM'
     Inst Phys Conf Ser No 138 (1993) 239

Kirkland, A.I., Rodenburg, J.M., Saxton, W.O., Tsuno, K. and
Kawasaki, M.
     'Experimental super-resolution via tilt series reconstruction
	in the CTEM'
     Inst Phys Conf Ser No 138 (1993) 247

Plamann, T. and Rodenburg, J.M.
     'Thickness limitations of aberration-free projection imaging'
     Inst Phys Conf Ser No 138 (1993) 243

Rodenburg, J.M.
     'A New Look at the Resolution Problem'
     Micron and Microscopica Acta 23 (1992) 213

Rodenburg, J.M. and McCallum, B.C.
     'A Robust Solution to the Super-Resolution Phase Problem in
	STEM'
     10th Pfefferkorn conference on image processing, Scanning
	Microscopy
     Supplement 6 (1992) 223

Friedman, S.L., Rodenburg, J.M. and McCallum, B.C.
     'Phase Reconstruction Imaging in Scanning Transmission
	Microscopy via the Microdiffraction Plane'
     Inst Phys Conf Ser No 119 (1991) 491

Rodenburg, J.M.
     'Higher spatial resolution via signal processing of the
	microdiffraction plane'
     Inst Phys Conf Ser No 98 1 (1989) 103

Nellist, P.D., McCallum, B.C and Rodenburg, J.M.
     'STEM imaging of <110> tetrahedral semiconductors'
     Proc 13th ICEM, Paris (1994) 489

Plamann, T. and Rodenburg, J.M.
     'Simulations on super-resolution imaging of perfect crystals'
     Proc 13th ICEM, Paris (1994) 939

Rodenburg, J.M. and McCallum, B.C.
     'Super-resolution structure determination in STEM'
     Proc 10th Eur Cong on EM (Granada) vol 1 (1992) 125

McCallum, B.C. and Rodenburg, J.M.
     'Blind super-resolution'
     Proc 10th Eur Cong on EM (Granada) vol 1 (1992) 431

Plamann, T. and Rodenburg, J.M.
     'Three-dimensional scattering effects in phase-retrieval
	microscopy'
     Proc 10th Eur Cong on EM (Granada) vol 1 (1992) 659

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